Education and Experience

Postdoctoral Researcher

September 2022 – Present

Stanford University, USA · Advisor: Prof. Gordon Wetzstein

Postdoctoral Researcher

September 2021 – August 2022

Seoul National University, Republic of Korea · Advisor: Prof. Byoungho Lee

Alternative military service until August 2022

Ph.D. in Electrical and Computer Engineering

September 2015 – August 2021

Seoul National University, Republic of Korea · Advisor: Prof. Byoungho Lee

B.S. in Electrical and Computer Engineering & B.S. in Physics

March 2011 – February 2015

Seoul National University, Republic of Korea

Honors and Awards

NRF Postdoctoral Fellowship

2022

Nurturing Next-generation Researchers Program, National Research Foundation of Korea (NRF)

Outstanding Doctoral Thesis Award

2021

Department of Electrical and Computer Engineering, Seoul National University

Best Graduate Student Award

2021

Seoul National University

Doyeon Academic Paper Award

2020

Inter-university Semiconductor Research Center, Seoul National University

Best Paper Award of 2020

2020

WILEY ETRI Journal, Electronics and Telecommunications Research Institute (ETRI)

SPIE Optics and Photonics Education Scholarship

2020

International Society for Optics and Photonics (SPIE), USA

Incubic/Milton Chang Award

2017

Optical Society of America (OSA), Washington, USA

Emil-Wolf Award – Finalist

2017

Optical Society of America (OSA), Washington, USA

Best Paper Award – Grand Prize

2016

1st place out of 600 papers, Nano Korea 2016

Invited Talks and Presentations

Stanford SCIEN Colloquium

May 2025

"Nanophotonics and AI for display and imaging system applications"

Society for Information Display (SID) Display Week 2025

May 2025

"Nanophotonics and AI for Augmented Reality and Imaging Applications"

Seoul National University

Sept 2024

"Nanophotonics and AI for AR displays and imaging applications"

KAIST

Sept 2024

"Nanophotonics and AI for AR displays and imaging applications"

KIST

Sept 2024

"Nanophotonics and AI for AR displays and imaging applications"

Apple

Aug 2024

"Full-color 3D holographic augmented reality displays with metasurface waveguides"

Synopsys

Jun 2024

"3D holographic AR glasses with metasurface waveguides"

Stanford University

Jun 2024

"3D holographic AR glasses with metasurface waveguides" (invited by Prof. Mark Brongersma)

Pohang University of Science and Technology (POSTECH)

Feb 2024

"Recent advances in Meta-optics for imaging and AR/VR devices" (invited by Prof. Seung-Hwan Baek and Prof. Junsuk Rho)

Samsung Research

Feb 2024

"Recent advances in Meta-Optics for imaging and AR/VR devices"

Samsung Advanced Institute of Technology (SAIT)

Feb 2024

"Nanophotonics for optical imaging and displays"

Seoul National University – GoGE Workshop

Oct 2023

"Metasurface Optics for next-generation displays"

Stanford University

Oct 2022

"Metasurface Optics towards next-generation imaging systems" (invited by Prof. Mark Brongersma)

Synopsys

Sept 2022

"Meta-Optics: Fundamentals and Design methods"

Stanford University

Feb 2022

"Metasurface optics towards next-generation imaging systems" (invited by Prof. Gordon Wetzstein)

Professional Service

Journal Reviewer

Nature, Nature Reviews Electrical Engineering, Science Advances, Light: Science & Applications, Optica, npj Nanophotonics, Optics Express, Optics Letters, ACS Photonics, Nanophotonics, Scientific Reports

Conference Reviewer

ACM SIGGRAPH, ACM SIGGRAPH Asia, IEEE International Symposium on Mixed and Augmented Reality

Skills

Numerical Simulations

  • Nanophotonics: FEM (COMSOL), RCWA (MATLAB, Python), FDTD (Lumerical), CST Studio
  • Optical simulations: Ray optics (Zemax), Wave optics (MATLAB, Python)
  • Programming: Python, MATLAB

Optics

  • Laser experiments: DPSS lasers, Tunable lasers, Supercontinuum lasers, Ultrafast lasers
  • Optical imaging: Holographic microscopy, AR/VR display systems, Phase contrast microscopy

Device Fabrication & Characterization

  • Nanofabrication: FIB milling, E-beam/PECVD/LPCVD deposition, RIE, E-beam lithography
  • Characterization: SEM, NSOM, FTIR, Polarimeters, Ellipsometry